The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Apr. 29, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shiqiang Wang, White Plains, NY (US);

Tiffany Tuor, London, GB;

Changchang Liu, White Plains, NY (US);

Thai Franck Le, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01);
Abstract

Techniques for adaptive asynchronous federated learning are described herein. An aspect includes providing a first version of a global parameter to a first client and a second client. Another aspect includes receiving, from the first client, a first gradient, wherein the first gradient was computed by the first client based on the first version of the global parameter and a respective first local dataset of the first client. Another aspect includes determining whether the first version of the global parameter matches a most recent version of the global parameter. Another aspect includes, based on determining that the first version of the global parameter does not match the most recent version of the global parameter, selecting a version of the global parameter. Another aspect includes aggregating the first gradient with the selected version of the global parameter to determine an updated version of the global parameter.


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