The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Aug. 13, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jinsung Kim, White Plains, NY (US);

Lev S. Bishop, Dobbs Ferry, NY (US);

John A. Smolin, Yorktown, NY (US);

Antonio Corcoles-Gonzalez, Mount Kisco, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/00 (2022.01); G06F 30/20 (2020.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06N 10/00 (2019.01); G06F 17/18 (2013.01); G06F 30/20 (2020.01);
Abstract

A method for characterizing noise in a quantum system, the quantum system including a plurality of qubits and a plurality of entangling gates native to the quantum system, includes generating a random quantum circuit on a quantum processor, the random quantum circuit comprising the plurality of entangling gates native to the quantum system. The method includes running a simulation of the random quantum circuit on a classical computer a plurality of times to obtain ideal outcomes, and running the random quantum circuit on the quantum processor a plurality of times to obtain experimental outcomes. The method includes grouping the experimental outcomes based on probabilities of the ideal outcomes to obtain a first distribution, and grouping the experimental outcomes based on probabilities of the experimental outcomes to obtain a second distribution. The method includes characterizing noise in the quantum system based on the first distribution and the second distribution.


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