The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Apr. 26, 2017
Megachips Corporation, Osaka, JP;
Kyushu Institute of Technology, Kitakyushu, JP;
Norikazu Ikoma, Fukuoka, JP;
Hiromu Hasegawa, Osaka, JP;
MEGACHIPS CORPORATION, Osaka, JP;
KYUSHU INSTITUTE OF TECHNOLOGY, Kitakyushu, JP;
Abstract
Provided is a state determination apparatus that appropriately performs pattern classification processing and/or pattern determination processing even when a map generated by the SOM technique includes discontinuous image regions. In the state determination apparatus, the matching processing unit obtains adaptability data indicating a correlation degree between template data indicating a state and the SOM output data. The state determination unit obtains a state evaluation value based on an activity value obtained by the activity value obtaining unit and the adaptability value. The time series estimation unit determines a state of an input data based on the state evaluation value and state transition probability between states. This allows for appropriately performing pattern classification processing and/or pattern determination processing even when a map generated by the SOM technique includes discontinuous image regions.