The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Apr. 26, 2020
Applicant:

Kyndryl, Inc., New York, NY (US);

Inventors:

Sai Zeng, Yorktown Heights, NY (US);

Braulio Gabriel Dumba, Elmsford, NY (US);

Jun Duan, Yorktown Heights, NY (US);

Matthew Staffelbach, White Plains, NY (US);

Emrah Zarifoglu, San Mateo, CA (US);

Umar Mohamed Iyoob, Pflugerville, TX (US);

Manish Mahesh Modh, Cedar Park, TX (US);

Assignee:

KYNDRYL, INC., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01); G06Q 40/06 (2012.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06Q 40/06 (2013.01);
Abstract

A machine learning assessment system is provided. The system identifies multiple datasets and multiple machine learning (ML) modeling algorithms based on the client profile. The system assesses a cost of data collection for each dataset of the multiple datasets. The system assesses a performance metric for each ML modeling algorithm of the multiple modeling algorithms. The system recommends a dataset from the multiple datasets and an ML modeling algorithm from the multiple ML modeling algorithm based on the assessed costs of data collection for the multiple datasets and the assessed performance metrics for the multiple ML modeling algorithms.


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