The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Dec. 06, 2017
Accenture Global Solutions Limited, Dublin, IE;
Mingzhu Lu, San Jose, CA (US);
ACCENTURE GLOBAL SOLUTIONS LIMITED, Dublin, IE;
Abstract
A process integrity evaluation system ensures integrity of unstructured processes. The process integrity evaluation system handles structured, semi-structured, and unstructured data at massive and large scale. The system provides scalability, secure storage, indexing, knowledge storage, and visualizations of processes by information retrieval, natural language processing, cloud computing, large scale machine learning, knowledge discovery, and other artificial intelligence techniques. Self-provided data, systematically gathered data, and potentially related data from additional sources are incorporated in the process integrity evaluation system which provides the core capabilities of data integrity checking, entity extraction, entity resolution, entity categorization, entity relationship extraction, processes extraction and reconstruction based on knowledge storage, such as knowledge graphs, inference functions, and evaluation computations. After extracting and reconstructing unstructured processes successfully, machine learning functions compute an integrity assurance score, e.g., a similarity, between extracted documents and the internal records in addition to an evaluation result, which can ensure the integrity of the unstructured processes.
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