The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Sep. 11, 2017
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Ena Ishii, Kanagawa, JP;

Mikito Iwamasa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/13 (2020.01); G06F 30/367 (2020.01); F24F 11/30 (2018.01); F24F 11/46 (2018.01); G06F 30/20 (2020.01); F24F 110/00 (2018.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); F24F 11/30 (2018.01); F24F 11/46 (2018.01); G06F 30/13 (2020.01); G06F 30/20 (2020.01); F24F 2110/00 (2018.01); F25B 2500/19 (2013.01);
Abstract

A parameter estimation apparatus of an embodiment of the present invention is provided with a model reduction processor and a parameter estimator. The model reduction processor generates reduced order models by reducing order of a simulation model on the basis of measurement data sets and conditions for model order reduction possibility. The parameter estimator estimates values of parameters of the reduced order models on the basis of the reduced order models and the measurement data sets corresponding to the reduced order models. Further, after estimating a first value for a first parameter of a first reduced order model based on a first measurement data set, the parameter estimator applies the first value to the first parameter of a second reduced order model based on a second measurement data set.


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