The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Nov. 10, 2020
International Business Machines Corporation, Armonk, NY (US);
Nicholas Linck, San Jose, CA (US);
Sangeetha Seshadri, Plano, CA (US);
Paul Henri Muench, San Jose, CA (US);
Umesh Deshpande, San Jose, CA (US);
Priyaranjan Behera, Santa Clara, CA (US);
Wilfred Edmund Plouffe, Jr., San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method according to one embodiment includes causing a failure event in each of a plurality of microservices of a system and collecting failure effect data associated with the caused failure events. A mapping is created detailing transition of the microservices between different states and the collected failure effect data is analyzed for creating the mapping. The method further includes outputting a predetermined notification in response to a determination that a first of the microservices is close to experiencing a predicted failure event, and outputting a suggested solution for repairing the system in response to a determination that the system has failed, using the mapping to identify a root cause of the system failure. Using the mapping to identify the root cause of the system failure includes identifying the microservices that caused the system failure.