The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Jun. 24, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Soma Shekar Naganna, Bangalore, IN;

Abhishek Seth, Deoband, IN;

Neeraj Ramkrishna Singh, Bangalore, IN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/067 (2013.01); G06F 3/0626 (2013.01); G06F 9/5016 (2013.01); G06F 9/5072 (2013.01);
Abstract

An approach is provided for providing optimized identification of duplicate data in a networked computing environment. An aggregate feature vector is created that is specific to an attribute of the data (e.g., a field that holds specific informational content). The aggregate feature vector has a set of dimensions that each define a specific comparison function used to test for similarity between data entries in the attribute. Each dimension in the aggregate feature vector is assigned an effectiveness, and a cost is computed for each dimension. Based on these two, a subset of dimensions is selected to form an optimized feature vector. This optimized feature vector can then be used to analyze a dataset to find matching data.


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