The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Mar. 26, 2020
Applicants:

Mimaki Engineering Co., Ltd., Nagano, JP;

National University Corporation Chiba University, Chiba, JP;

Inventors:

Norimichi Tsumura, Chiba, JP;

Junki Yoshii, Chiba, JP;

Keita Hirai, Chiba, JP;

Wataru Arai, Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 10/00 (2015.01); G05B 13/02 (2006.01); B33Y 50/02 (2015.01); B29C 64/112 (2017.01); B29C 64/393 (2017.01); G06N 20/00 (2019.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G05B 13/0265 (2013.01); B29C 64/112 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G06N 5/04 (2013.01); G06N 20/00 (2019.01); B29K 2995/0021 (2013.01);
Abstract

A layer configuration prediction method is provided and includes: a specimen production step of producing multiple specimens by depositing layers of a material in configurations different from each other; a specimen measurement step of performing, on each specimen, measurement to acquire a texture parameter corresponding to a texture; a learning step of causing a computer to perform machine learning of a relation between each of the specimens and the texture parameter; a setting parameter calculation step of calculating a setting parameter corresponding to the texture set to a computer graphics image; and a layer configuration acquisition step of providing the setting parameter as an input to the computer having been caused to perform the machine learning, and acquiring an output representing the layering pattern of layers of the material corresponding to the setting parameter.


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