The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Dec. 23, 2019
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Ryan Scott, Woodland, CA (US);

Bogdan Szafraniec, Sunnyvale, CA (US);

Mike T. Mctigue, Colorado Springs, CO (US);

Howard Lankford, Colorado Springs, CO (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/308 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 13/02 (2006.01); G02F 1/21 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0281 (2013.01); G01R 1/06777 (2013.01); G02F 1/21 (2013.01); G02F 1/212 (2021.01);
Abstract

An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument is disclosed. The apparatus includes a probe head configured to receive an electrical signal from the DUT. The probe head includes an electro-optic modulator. The apparatus also includes a control box, which includes an optical source. The optical source is configured to provide an input optical signal to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT. The control box also includes an optical bias control circuit. Only a bias control signal is provided to the electro-optic modulator.


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