The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Oct. 26, 2020
Mettler-toledo (Changzhou) Precision Instruments Co., Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Measurement Technology Co., Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Jianwei Wu, Zhangzhou, CN;
Jean-Christophe Emery, Zhangzhou, CN;
Mettler-Toledo (Changzhou) Precision instruments Co., Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A method for adjusting parameters of a device with a weighing sensor collecting environmental parameter data of an environment where the device is currently located or environmental parameter data during execution of an application by the device. A zero compensation parameter is calculated and updated, based on the data collected. The method is applicable to a moisture analyzer and also to a vehicle scale. In the moisture analyzer, the method is triggered and executed in the analyzer, correcting the zero compensation data by using the environmental parameter data of an environment or environmental parameter data during execution of an application by the analyzer. Dynamic and real-time adjustment of a compensation parameter overcomes the problem that the scheme of pre-setting fixed parameters for zero compensation cannot deal with the complex zero drift encountered in actual environments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile