The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

May. 08, 2019
Applicant:

Ams Ag, Premstätten, AT;

Inventors:

Alessandro Faes, Premstatten, AT;

Sophie Guillemin, Graz, AT;

Joerg Siegert, Graz, AT;

Karl Tuttner, Hofstatten an der Raab, AT;

Assignee:

AMS AG, Premstätten, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00547 (2013.01); B81C 1/00476 (2013.01); B81C 1/00531 (2013.01); B81C 2201/0104 (2013.01); B81C 2201/014 (2013.01); B81C 2201/0122 (2013.01); B81C 2201/0132 (2013.01); B81C 2201/053 (2013.01);
Abstract

The disclosure relates to a method for manufacturing a planarized etch-stop layer, ESL, for a hydrofluoric acid, HF, vapor phase etching process. The method includes providing a first planarized layer on top of a surface of a substrate, the first planarized layer having a patterned and structured metallic material and a filling material. The method further includes depositing on top of the first planarized layer the planarized ESL of an ESL material with low HF etch rate, wherein the planarized ESL has a low surface roughness and a thickness of less than 150 nm, in particular of less than 100 nm.


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