The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Aug. 31, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Akihiko Enamito, Kawasaki, JP;

Osamu Nishimura, Kawasaki, JP;

Tatsuhiko Goto, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 1/40 (2006.01); H04R 1/28 (2006.01); H04R 1/24 (2006.01); H04R 3/00 (2006.01);
U.S. Cl.
CPC ...
H04R 1/406 (2013.01); H04R 1/245 (2013.01); H04R 1/2811 (2013.01); H04R 3/005 (2013.01);
Abstract

An acoustic inspection apparatus includes a vibration sound source, a microphone group, and a processor. The vibration sound source emits a vibration sound to an inspection target object. The microphone group includes a first microphone arranged near the inspection target object and a second microphone arranged to have an interval with respect to the first microphone. The processor calculates a first impulse response between the first and second microphones, denoises a component corresponding to the vibration sound from the first impulse response, converts, into a frequency characteristic, a second impulse response obtained from the first impulse response, calculates acoustic energy between the first and second microphones based on the frequency characteristic, and determines an abnormal state of the inspection target object based on the acoustic energy.


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