The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

May. 29, 2019
Applicant:

Interdigital Vc Holdings, Inc., Wilmington, DE (US);

Inventors:

Didier Doyen, La Bouexiere, FR;

Olivier Bureller, Cesson-Sevigne, FR;

Guillaume Boisson, Pleumeleuc, FR;

Assignee:

InterDigital VC Holdings, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/105 (2014.01); H04N 19/182 (2014.01); H04N 19/597 (2014.01);
U.S. Cl.
CPC ...
H04N 19/597 (2014.11); H04N 19/105 (2014.11); H04N 19/182 (2014.11);
Abstract

Predicting a component of a current pixel belonging to a current sub-aperture image in a matrix of sub-aperture images captured by a sensor of a type I plenoptic camera can involve, first, determining a location on the sensor based on: a distance from an exit pupil of a main lens of the camera to a micro-lens array of the camera; a focal length of the main lens; a focal length of the micro-lenses of the micro-lens array; and a set of parameters of a model of the camera allowing for a derivation of a two-plane parameterization describing the field of rays corresponding to the pixels of the sensor; and, second, predicting the component based on one reference pixel belonging to a reference sub-aperture image in the matrix and located on the sensor in a neighborhood of the location.


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