The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Jun. 15, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventor:
Yosuke Tashiro, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00034 (2013.01); H04N 1/00037 (2013.01); H04N 1/00047 (2013.01); H04N 1/00076 (2013.01); H04N 1/00084 (2013.01); H04N 1/00087 (2013.01);
Abstract
An inspection device includes a processor configured to display at least one of plural pieces of read image data on a display unit in a state where a defective portion is recognizable, and set reception of a correction instruction of the defective portion to be enabled, the plural pieces of read image data being obtained by reading image-formed matters obtained by forming original image data on plural recording media, and correct read image data that does not satisfy a predetermined criterion, and then register the corrected read image data as reference image data used for inspecting the image-formed matter.