The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Apr. 29, 2021
Applicant:

L3harris Technologies, Inc., Melbourne, FL (US);

Inventors:

Anthony D. Smith, Bluffdale, UT (US);

L. Andrew Gibson, Riverton, UT (US);

Joshua D. Christensen, Hooper, UT (US);

Jeffrey L. Burgoyne, Bountiful, UT (US);

Assignee:

L3HARRIS TECHNOLOGIES, INC., Melbourne, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04K 3/00 (2006.01);
U.S. Cl.
CPC ...
H04K 3/224 (2013.01); H04K 3/42 (2013.01); H04K 3/43 (2013.01); H04K 3/44 (2013.01); H04K 3/86 (2013.01);
Abstract

Techniques for providing a multi-stage iterative scheme to determine fine granularity estimates of parameters of an interfering signal and for using the fine granularity estimates of the parameters to reduce an impact of the interfering signal against a signal of interest (SOI) are disclosed. An input signal is identified. A first set of estimation parameters that provide a coarse granularity estimate of a center frequency of the jamming signal and of a symbol rate of the jamming signal are determined. The first set of estimation parameters are refined to generate a medium granularity estimate of the center frequency and the symbol rate of the jamming frequency. The medium granularity estimates are also refined to produce a fine granularity estimate of the center frequency and the symbol rate. The fine granularity estimates are used to remove or reduce an influence of the jamming signal on the input signal.


Find Patent Forward Citations

Smith, Anthony. (2023). Algorithm and techniques for high-resolution interference parameter estimation in low-swap environment (U.S. Patent No. 11569927). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11569927

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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