The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Apr. 22, 2022
Applicant:

Avago Technologies International Sales Pte. Limited, Singapore, SG;

Inventors:

Seong-Ho Lee, Aliso Viejo, CA (US);

SangHye Chung, Irvine, CA (US);

Hyung-Joon Jeon, Irvine, CA (US);

Vadim Milirud, Lake Forest, CA (US);

Wei Zhang, Irvine, CA (US);

Angus Tang, Mission Viejo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/13 (2014.01); H03K 5/01 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/01 (2013.01); H03K 2005/00058 (2013.01);
Abstract

An apparatus includes control logic coupled to a phase detector circuit and an adjustable delay circuit. The control logic is configured to obtain a state of a first phase of an output signal of a phase interpolator relative to a second phase of a reference signal, and adjust a delay of the reference signal until the second phase matches the first phase. The control logic is further configured to measure a total delay of the reference signal when the second phase matches the first phase, and determine integral non-linearity of the phase interpolator at the first code based on the total delay. The control logic may further calibrate a first code of a phase interpolator based, at least in part, on the integral non-linearity.


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