The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jul. 14, 2020
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Hyomin Ko, Yongin-si, KR;

Changmin Lee, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/54 (2006.01); H01L 51/50 (2006.01); H01L 51/52 (2006.01); H01L 51/00 (2006.01); H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5056 (2013.01); H01L 51/006 (2013.01); H01L 51/5265 (2013.01); H01L 27/3211 (2013.01); H01L 51/5016 (2013.01); H01L 51/5064 (2013.01); H01L 2251/5392 (2013.01); H01L 2251/558 (2013.01);
Abstract

An organic light-emitting device includes: a first pixel electrode on a first emission region, a second pixel electrode on a second emission region, and a third pixel electrode on a third emission region; a counter electrode facing each of the first pixel electrode, the second pixel electrode, and the third pixel electrode; and an interlayer between the counter electrode and each of the first pixel electrode, the second pixel electrode, and the third pixel electrode. The interlayer includes an emission layer, and a hole transport region between the emission layer and each of the first pixel electrode, the second pixel electrode, and the third pixel electrode, the hole transport region includes a planarization layer that includes an amine-based compound represented by Formula 1, Formula 2A, or Formula 2B, and the amine-based compound has a crystallization peak having a noise-to-peak ratio of 1.75 or more in an X-ray diffraction (XRD) spectrum.


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