The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Nov. 25, 2019
Applicant:

Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd., Hubei, CN;

Inventors:

Rui Lu, Hubei, CN;

Cunjun Xia, Hubei, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 51/00 (2006.01); H01L 51/52 (2006.01); H01L 51/56 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 51/0031 (2013.01); H01L 22/10 (2013.01); H01L 51/5253 (2013.01); H01L 51/56 (2013.01);
Abstract

The present invention provides a method for testing performance of thin-film encapsulation. Through different combination designs of film layers, lateral water vapor intrusion paths of various thin films or encapsulation structures are formed, thereby obtaining a means to inspect a lateral water vapor and oxygen barrier capacity of thin films and provide a highly effective inspection means for encapsulation of display panels.


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