The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

May. 25, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Hiroyuki Miura, Kyoto, JP;

Hideaki Izumi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/24 (2006.01); H01J 49/40 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); H01J 49/005 (2013.01); H01J 49/0468 (2013.01); H01J 49/24 (2013.01); H01J 49/40 (2013.01);
Abstract

Provided is a method for mass spectrometry in which ions to be analyzed are made to come in contact with a cooling gas in a cooling section, such as an ion trap, configured to perform the cooling of ions, and kinetic energy is subsequently imparted to the ions so as to introduce the ions into a flight space of a multi-turn time-of-flight mass separatoror similar device for separating ions according to their mass-to-charge ratios. According to the present invention, when a known or estimated number of charges of an ion to be analyzed is high, the amount of supply of the cooling gas to the cooling section is set to a lower level than when the number of charges is low. This operation improves the detection sensitivity for ions having large molecular weights and high numbers of charges.


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