The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jul. 01, 2020
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Youngjun Park, Icheon-si, KR;

Youngjun Ku, Icheon-si, KR;

Junil Moon, Icheon-si, KR;

Byungkuk Yoon, Icheon-si, KR;

Seokwoo Choi, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/32 (2006.01); G01R 31/3177 (2006.01); G11C 29/12 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 29/32 (2013.01); G01R 31/3177 (2013.01); G01R 31/31717 (2013.01); G11C 29/1201 (2013.01);
Abstract

A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.


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