The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Mar. 27, 2020
Fanuc Corporation, Yamanashi, JP;
Mitsunori Watanabe, Yamanashi, JP;
Keisuke Watanabe, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An inspection apparatus includes a group data creation unit configured to create group data obtained by dividing a plurality of samples into a plurality of groups, a statistical state calculation unit configured to perform a statistical process for the samples divided into each of the groups to calculate data indicating a statistical state of a predetermined data item between the groups, and a user interface unit configured to display the statistical state in a display format enabling recognition of the statistical state between the groups on the basis of the data indicating the statistical state of the predetermined data item between the groups calculated by the statistical state calculation unit.