The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

May. 28, 2020
Applicant:

The Nielsen Company (Us), Llc, New York, NY (US);

Inventors:

Joshua Ivan Friedman, New York, NY (US);

Tara Zeynep Baris, New York, NY (US);

Neel Parekh, New York, NY (US);

Assignee:

THE NIELSEN COMPANY (US), LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); H04N 21/466 (2011.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06N 3/0472 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06Q 30/0201 (2013.01); G06Q 30/0254 (2013.01); H04N 21/4663 (2013.01); H04N 21/4666 (2013.01);
Abstract

Example methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to perform probabilistic modeling for anonymized data integration and measurement of sparse and weakly-labeled datasets are disclosed. An apparatus includes a training controller to train a neural network to produce a trained neural network to output model parameters of a probability model, a model evaluator to execute the trained neural network on input data specifying a time of day, a media source, and at least one feature different from the time of day and the media source to determine one or more first model parameters of the probability model, and a ratings metric generator to evaluate the probability model based on input census data to determine a ratings metric corresponding to the time of day, the media source, and the at least one feature, the probability model configured with the one or more first model parameters.


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