The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Oct. 08, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yasuho Yamashita, Tokyo, JP;

Takuma Shibahara, Tokyo, JP;

Mayumi Suzuki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 7/00 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 3/0472 (2013.01); G06K 9/6257 (2013.01); G06N 7/005 (2013.01);
Abstract

The analyzing apparatus: generates first internal data; converts a position of first feature data in a feature space, based on the first internal data and a second learning parameter; reallocates, based on a result of first conversion and the first feature data, the first feature data to a position obtained through the conversion in the feature space; calculates a predicted value of a hazard function of analysis time in a case where the first feature data is given, based on a result of reallocation and a third learning parameter; optimizes the first to third learning parameters, based on a response variable and a first predicted value; generates second internal data, based on second feature data and the optimized first learning parameter; converts a position of the second feature data in the feature space, based on the second internal data and the optimized second learning parameter; and calculates importance data.


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