The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jan. 19, 2015
Applicants:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Toshiba Solutions Corporation, Kawasaki, JP;

Inventors:

Hideki Iwasaki, Fuchu, JP;

Shigeaki Sakurai, Yokohama, JP;

Rumi Hayakawa, Yokohama, JP;

Shigeru Matsumoto, Nishitokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2006.01); G06K 9/62 (2022.01); G06N 5/02 (2006.01); G06Q 30/02 (2012.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06N 5/025 (2013.01); G06N 5/047 (2013.01); G06Q 10/10 (2013.01); G06Q 30/0201 (2013.01); G06Q 30/0202 (2013.01); G06N 20/00 (2019.01);
Abstract

A sequential data analysis apparatus extracts a pattern of two or more sets of items based on an appearance frequency of each of different sets of items in first sequential data, selects a pattern of two or more sets of items based on an appearance frequency of a sub-pattern formed of a portion of the extracted pattern, creates a related pattern including the same last set of items as and the other sets of items different from the selected characteristic pattern, calculates an evaluation value of the related pattern, creates a prediction model by organizing data of the characteristic pattern and the related pattern, and applies second sequential data to the prediction model to determine a result which the second sequential data is likely to lead to.


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