The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Dec. 11, 2019
Applicant:

Imvision Software Technologies Ltd., Ramat Gan, IL;

Inventors:

Liora Braunstein, Tel Aviv, IL;

Keren Cohavi, Tel-Aviv, IL;

Yoav Spector, Ramat Gan, IL;

Kiril Lashchiver, Kiryat Ono, IL;

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/205 (2020.01); G06K 9/62 (2022.01); G06F 40/237 (2020.01); G06V 30/414 (2022.01);
U.S. Cl.
CPC ...
G06F 40/205 (2020.01); G06F 40/237 (2020.01); G06K 9/6217 (2013.01); G06V 30/414 (2022.01);
Abstract

A system and method for detecting anomalies in mission-critical environments. The method includes: parsing at least one received data set into a text structure; isolating a protocol language of the at least one received data set, wherein the protocol language is a standardized pattern for communication over at least one protocol; generating at least one document from the contents of the received at least one data set, wherein the at least one document includes at least one parsed text structure referencing a unique identifier, and wherein the at least one parsed text structure is organized within the at least one document according to a natural language scheme; detecting insights in the generated documents; extracting rules from the detected insights; and detecting anomalies by applying the extracted rules.


Find Patent Forward Citations

Braunstein, Liora. (2023). Method and apparatus for detecting anomalies in mission critical environments (U.S. Patent No. 11568133). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11568133

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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