The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Oct. 02, 2019
Applicant:
Honeywell International Inc., Morris Plains, NJ (US);
Inventors:
Ganesh Gadhe, Phoenix, AZ (US);
Eric Knapp, Boston, MA (US);
Virgil Mehalek, Dover, NH (US);
Doug Swain, Dover, NH (US);
Assignee:
Honeywell International Inc., Morris Plains, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 21/57 (2013.01); G05B 19/042 (2006.01); G06F 16/953 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G05B 19/0425 (2013.01); G06F 16/9014 (2019.01); G06F 16/953 (2019.01);
Abstract
Method, apparatus and computer program product for detecting vulnerability and predicting maintenance in an industrial control system are described herein.
Gadhe, Ganesh. (2023). Methods and apparatuses for vulnerability detection and maintenance prediction in industrial control systems using hash data analytics (U.S. Patent No. 11568056). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11568056
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile