The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Jul. 20, 2021
Applicant:
Sap SE, Walldorf, DE;
Inventors:
Jaeyeon Won, Cambridge, MA (US);
Sung Gun Lee, Seoul, KR;
Sanghee Lee, Seoul, KR;
Boyeong Jeon, Seoul, KR;
Hyung Jo Yoon, Seoul, KR;
JunGyoung Seong, Seoul, KR;
Assignee:
SAP SE, Walldorf, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 16/2455 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24552 (2019.01); G06F 16/24542 (2019.01);
Abstract
A computer-implemented method can measure query locality during execution of a plurality of incoming queries in a database management system. The database management system includes a query execution plan cache which has a size that can store at least some of query execution plans generated for the plurality of incoming queries. Based on the measured query locality, the method can adjust the size of the query execution plan cache.