The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
May. 29, 2020
Noodle Analytics, Inc., San Francisco, CA (US);
Ravishankar Balasubramanian, Karnataka, IN;
Soham Chakraborty, Karnataka, IN;
Vaishakh Purohit Jagadeesh, Karnataka, IN;
Muhammed Jaish Kadooran, Kerala, IN;
Noodle Analytics, Inc., San Francisco, CA (US);
Abstract
A spurious outlier detection-system is provided. The system includes a memory having computer-readable instructions stored therein and a processor configured to execute the computer-readable instructions to receive time-series data from one or more sensors and/or applications, process the time-series data to detect one or more change points based on a pre-defined cost function. The processor is configured to identify data chunks between the change points using pre-determined window sizes and to estimate smooth reconstructed values (SRVs) for each of the change point data chunks between two consecutive change points to identify one or more global outliers from the SRVs. The processor is configured to determine distribution of the global outliers using kernel density for each change point data chunk and identify one or more true outliers from the distribution of the global outliers based upon a skewness of the distribution.