The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Apr. 23, 2020
Applicant:

Datometry, Inc., San Francisco, CA (US);

Inventors:

Alberto Bengoa, Sunnyvale, CA (US);

Michael Alexander Duller, San Francisco, CA (US);

Deepak Patel, Fremont, CA (US);

Dmitri Korablev, San Francisco, CA (US);

Florian Michael Waas, San Francisco, CA (US);

Assignee:

DATOMETRY, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/2455 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/214 (2019.01); G06F 16/221 (2019.01); G06F 16/2282 (2019.01); G06F 16/24554 (2019.01);
Abstract

Some embodiments provide a method for migrating data from a first database to a second database. The method uses a data segmentation process to dynamically determine a set of segmentation criteria for a particular portion of the first database. The method uses the set of segmentation criteria to divide the particular portion of the first database into multiple data segments. The method incrementally transfers the multiple data segments from the first database to the second database.


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