The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Mar. 18, 2021
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Hua-Ming Zhai, Shanghai, CN;

Er-Xin Shang, Shanghai, CN;

Kai Zhou, Shanghai, CN;

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3075 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

Embodiments of the disclosure provide systems and methods for executing a functional test on an application. According to one embodiment, a method for running a functional test on an application can comprise executing the function test on the application. The functional test can comprise a plurality of steps. The plurality of steps can comprise a set of related steps having one or more relationships between each other and a set of one or more independent steps having no relationships to other steps in the plurality of steps. The one or more relationships between the set of related steps can be deduced and an indication of the deduced one or more relationships between the set of related steps can be saved. The functional test can then be replayed on the application based on the saved indication of the deduced one or more relationships between the set of related steps.


Find Patent Forward Citations

Loading…