The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Oct. 13, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Tadashi Hattori, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0002 (2013.01);
Abstract

The present invention provides an imprint apparatus including a holding unit configured to hold a material, a measurement unit configured to measure a position of the material held by the holding unit, a detection unit configured to detect dechucking of the material in the holding unit, and a control unit configured to control continuation processing for continuing an imprint process if the detection unit has detected the dechucking, wherein the control unit performs, as the continuation processing, processing of causing the holding unit to hold the dechucked material again without unloading the material from the imprint apparatus, and processing of measuring, by the measurement unit, a position of the material held again by the holding unit before the imprint process to use the position for alignment in the imprint process.


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