The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Jul. 25, 2019
Istituto Nazionale Di Fisica Nucleare, Frascati, IT;
Milena D'Angelo, Bari, IT;
Francesco Vincenzo Pepe, Bari, IT;
Alessio Scagliola, Bari, IT;
Francesco Maria Di Lena, Casamassima, IT;
Augusto Garuccio, Bari, IT;
ISTITUTO NAZIONALE DI FISICA NUCLEARE, Frascati, IT;
Abstract
A system for acquiring microscopic plenoptic images with attenuation of turbulence by a microscope includes, in combination: a sample, the image of which should be obtained, which is able to be treated as a source of chaotic light, whose emission has an intensity profile F(ρs), with ρs planar coordinate on the sample plane; a beam separator; two sensors or detectors, configured to perform the spatial/directional and directional/spatial detection, respectively, in which the planar coordinate on the detector planes is respectively indicated with ρa and ρb; an objective lens, having focal length fO and pupil function PO(ρO), with ρO planar coordinate on the plane of the lens; a second lens, having focal length fT and pupil function PT(ρT), with ρT planar coordinate on the plane of the lens; wherein the second lens is arranged in the optical path (a/b) of the beam transmitted/reflected by the beam separator.