The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Sep. 09, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Ryuji Saneto, Kanagawa, JP;

Shuntaro Ibuki, Kanagawa, JP;

Shusuke Arita, Kanagawa, JP;

Yuta Fukushima, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/118 (2015.01);
U.S. Cl.
CPC ...
G02B 1/118 (2013.01); Y10T 428/24372 (2015.01);
Abstract

A laminate includes a substrate; and a layer (a) containing particles forming a specific uneven shape, the number of particles present on the surface of the layer (a) is 6.3 to 20 per 1 μm, and a heat shrinkage rate of the laminate in a case of being heated for one hour at a glass transition temperature of the substrate+10° C. is 20% or more and less than 70%. An antireflection product has a three-dimensional curved surface having a curvature radius of 1 to 1,000 mm, and has a specific uneven shape formed of particles on the three-dimensional curved surface, the number of metal oxide particles present on the three-dimensional curved surface is 9 to 40 per 1 μm, and a difference between a maximum value and a minimum value of reflectivities is less than 1.2%.


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