The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Oct. 28, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 7/48 (2006.01); G01S 17/08 (2006.01); G01S 7/4865 (2020.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4865 (2013.01); G01S 17/08 (2013.01); G01S 7/497 (2013.01);
Abstract

An object monitoring system includes a distance measuring device which generates, while repeating an imaging cycle having different imaging modes, a distance image of a target space for each of the imaging modes, and a computing device which determines presence or absence of an object within a monitoring area set in the target space based on the distance image.


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