The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jun. 09, 2020
Applicant:

Playnitride Display Co., Ltd., Miaoli County, TW;

Inventors:

Jyun-De Wu, Miaoli County, TW;

Yen-Lin Lai, Miaoli County, TW;

Chi-Heng Chen, Miaoli County, TW;

Assignee:

PLAYNITRIDE DISPLAY CO., LTD., Miaoli County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); H01L 33/00 (2010.01);
U.S. Cl.
CPC ...
G01R 31/302 (2013.01); H01L 33/005 (2013.01);
Abstract

Herein disclosed are a wafer, a wafer testing system, and a method thereof. Said wafer testing method comprises the following steps. First, an incident light is provided toward a wafer. And, a wafer surface image corresponded to the wafer is generated. Then, determining whether the wafer surface image has a plurality of first strips and a plurality of second strips, and the plurality of first strips and the plurality of second strips are symmetrical. When the wafer surface image has the plurality of first strips and the plurality of second strips, and the plurality of first strips and the plurality of second strips are symmetrical, a qualified signal corresponded to the wafer is provided.


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