The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Oct. 15, 2020
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Takashi Kanno, Hyogo, JP;

Hiroto Yanagawa, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/64 (2006.01); G01N 33/553 (2006.01); B82Y 15/00 (2011.01); G02B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54386 (2013.01); G01N 21/648 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G01N 33/54373 (2013.01); G01N 33/553 (2013.01); G02B 5/008 (2013.01); B82Y 15/00 (2013.01); G01N 2021/6441 (2013.01); G01N 2333/005 (2013.01);
Abstract

One non-limiting and exemplary embodiment provides a metal microscopic structure capable of detecting a low-concentration analyte with high sensitivity. The metal microscopic structure includes a base member including multiple protrusions arrayed at predetermined intervals, and multiple projections made of a metal film covering the base member and configured to generate surface plasmons upon irradiation with light. A film thickness of the metal film positioned in a bottom portion of a gap between every adjacent two of the multiple projections is greater than a height of the multiple protrusions and is more than or equal to 90% and less than or equal to 100% of a film thickness of the metal film deposited on top portions of the multiple protrusions.


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