The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Sep. 21, 2018
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Masahito Ito, Tokyo, JP;

Ikuko Narimatsu, Tokyo, JP;

Kazuhiko Okuzawa, Tokyo, JP;

Hirofumi Toshima, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8637 (2013.01); G01N 30/8651 (2013.01); G01N 30/8662 (2013.01);
Abstract

A chromatographic data system processing apparatus includes a standard sample time table for prestoring a first retention time and a first allowable width of each peak of specific components of a standard sample, a determination unit for determining whether a number of peaks coincides with a specified number when a peak cannot be identified, an alteration unit for altering the standard sample time table by increasing the first allowable width of a specific component to an altered allowable width, an identification unit for identifying the peaks based on the altered standard sample time table when all peaks fall within a range of the altered allowable width, and a setting unit for acquiring an actually-measured retention time of the peaks, and setting a measurement sample time table based on the actually-measured retention time and a second allowable width when the peaks are identified based on the altered standard sample time table.


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