The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2023
Filed:
Mar. 30, 2021
Universitat Stuttgart, Stuttgart, DE;
Klaus Körner, Berlin, DE;
Alois M. Herkommer, Aalen, DE;
Universität Stuttgart, Stuttgart, DE;
Abstract
Fourier Transformation Spectrometer, FT Spectrometer, comprising: Michelson-Type Interferometer () comprising: at least one beam splitter unit designed to split an incident light beam (EB) of a spatially expanded object into a first partial beam (TB) and a second partial beam (TB); and for at least partially overlaying the first partial beam (TB) and the second partial beam (TB) with a lateral shear (s); a first beam deflection unit designed to deflect the first partial beam (TB) at least once; a second beam deflection unit designed to deflect the second partial beam (TB) at least once; wherein at least one among the first beam deflection unit and the second beam deflection unit represents a (2n+1) periscope group with (2n+1) mirror surfaces, and all (2n+1) mirror surfaces are arranged vertically in relation to a common reference plane, in order to respectively deflect the first partial beam (TB) and/or the second partial beam (TB) (2n+1) times, and wherein the (2n+1)-fold deflection generates the lateral shear (s) between the first partial beam (TB) and the second partial beam (TB), and wherein n is a natural number ≥1.