The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Feb. 26, 2021
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Jianhui Xu, Dhahran, SA;

Guodong Zhan, Dhahran, SA;

Bodong Li, Dhahran, SA;

Chinthaka P. Gooneratne, Dhahran, SA;

Arturo Magana Mora, Dhahran, SA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/56 (2006.01); G01N 3/58 (2006.01);
U.S. Cl.
CPC ...
G01N 3/56 (2013.01); G01N 3/58 (2013.01);
Abstract

A testing device that includes a wear testing device, a sensor array, and a controller. The wear testing device includes a sample rotation element configured to hold and to rotate a sample; and a cutting element holder configured to hold a cutting element and to engage the cutting element with the sample as the sample rotates. The sensor array includes an acoustic emissions (AE) sensor configured to measure an acoustic signal generated during engagement between the cutting element and the sample; and a load sensor. The controller is communicably connected to the sensor array and configured to determine a toughness and a wear resistance of the cutting element using the acoustic signal, the applied load, and a wear state of the cutting element.


Find Patent Forward Citations

Xu, Jianhui. (2023). In-situ property evaluation of cutting element using acoustic emission technology during wear test (U.S. Patent No. 11566988). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11566988

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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