The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Feb. 13, 2020
Applicant:

Honeywell International Inc., Morris Plains, NM (US);

Inventors:

Eduardo Gallestey Alvarez, Baden, CH;

Sarabjit Singh, Hyderabad, IN;

Shripad Kumar Pande, Tellapur, IN;

Seshagiri Yamarthi, Hyderabad, IN;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/18 (2006.01); G01K 15/00 (2006.01); G01K 7/22 (2006.01);
U.S. Cl.
CPC ...
G01K 7/18 (2013.01); G01K 7/22 (2013.01); G01K 15/005 (2013.01);
Abstract

A method, apparatus and system for measuring a temperature can involve measuring a voltage with a resistance temperature detector using a variable excitation current, and deriving a process temperature from the voltage measured by the resistance temperature detector. The process temperature can be further derived by applying a plurality of values of the variable excitation current, measuring corresponding values of voltage, and estimating a resistance by applying a least square estimation. The process temperature can also be derived by applying a different value of the variable excitation current at every iteration, using a recursive least square estimation to measure a resistance, and using confidence intervals for instrument diagnostics.


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