The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Feb. 18, 2020
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventor:

Daisuke Hirono, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); H01L 31/02 (2006.01); H01L 31/107 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); H01L 31/02027 (2013.01); H01L 31/107 (2013.01); G01J 2001/4466 (2013.01);
Abstract

A measurement device according to an embodiment includes: a light receiving element () that has flow of current caused by an avalanche multiplication caused according to a photon incidence while being charged to a predetermined potential and is returned to the charged state by a recharge current, a detection unit () that is configured to detect the current and invert an output signal when the current crosses a threshold value, a delay unit () that is configured to delay timing of the inversion detected by the detection unit, according to a clock, and a control unit () that is configured to control an operation of the light receiving element, based on the timing of the inversion delayed by the delay unit.


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