The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Oct. 14, 2020
Applicant:

Flir Unmanned Aerial Systems Ulc, Vancouver, CA;

Inventors:

April Deirdre Blaylock, Kitchener, CA;

Richard Patrick Ribeiro Cunha, Mississauga, CA;

Kuan-Yao Huang, Guelph, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 11/00 (2006.01); H04N 5/232 (2006.01); G06T 3/40 (2006.01); B64C 39/02 (2006.01); B64D 47/08 (2006.01); H04N 5/265 (2006.01);
U.S. Cl.
CPC ...
G01C 11/00 (2013.01); B64C 39/024 (2013.01); B64D 47/08 (2013.01); G06T 3/4038 (2013.01); H04N 5/23203 (2013.01); H04N 5/23299 (2018.08); H04N 5/265 (2013.01); B64C 2201/027 (2013.01); B64C 2201/127 (2013.01);
Abstract

A system, computer-implemented method and non-transitory computer readable medium storing instructions for generating a two-dimensional (2D) map of an area of interest are provided. The system comprises a processor and memory storing instructions which when executed by the processor configure the processor to perform the method. The method comprises determining a perimeter of an area of interest, obtaining nadir images of the area of interest, obtaining at least one oblique image of the area of interest from at least one corner of the perimeter, and processing the nadir and oblique images together to form the 2D map of the area of interest.


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