The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jan. 28, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Takao Mikoshiba, Nagano, JP;

Kenta Nomura, Nagano, JP;

Yoshio Murata, Nagano, JP;

Shinichi Miyazaki, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D21C 5/02 (2006.01); D21B 1/06 (2006.01); D21H 11/14 (2006.01); D21F 7/00 (2006.01);
U.S. Cl.
CPC ...
D21C 5/02 (2013.01); D21B 1/061 (2013.01); D21F 7/00 (2013.01); D21H 11/14 (2013.01);
Abstract

A sheet manufacturing system includes a processing section configured to process a raw material including a fiber, a detection section configured to detect a state of the raw material, a determination section configured to determine, based on a detection result of the detection section and a preset criterion of a raw material state, whether the raw material is suitable for processing in the processing section, a supply section configured to supply, to the processing section, the raw material determined to be suitable for the processing by the determination section, a reception section configured to acquire operation information indicating an occurrence state of an operation hindrance in the processing section, and a setting section configured to set the criterion based on the operation information.


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