The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Jun. 12, 2014
Applicant:

Waters Technologies Corporation, Milford, MA (US);

Inventors:

Christopher J. Hudalla, Milford, MA (US);

Abhijit Tarafder, Franklin, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D 15/40 (2006.01); B01D 15/16 (2006.01); G01N 30/86 (2006.01); G01N 30/32 (2006.01); B01J 3/02 (2006.01);
U.S. Cl.
CPC ...
B01D 15/40 (2013.01); B01D 15/16 (2013.01); B01D 15/163 (2013.01); B01J 3/02 (2013.01); G01N 30/32 (2013.01); G01N 30/8658 (2013.01); G01N 2030/326 (2013.01);
Abstract

A methodology scales supercritical fluid chromatography (SFC) and/or carbon dioxide based chromatography methods between different system and/or column configurations. The methodology includes measuring an average mobile phase density during a first separation utilizing C02 as a mobile phase component and substantially duplicating the average density profile for a second separation. Substantial duplication of the average mobile phase density (e.g., within about 10%, 5%, 2.5%, 1%, 0.5%, 0.1 %, 0.05%) results in chromatography for both system and/or column configurations having similar selectivity and retention factors. Average mobile phase density may be, either measured directly, calculated, or approximated using average pressure or density measurements. The average pressure profile may be used as a close approximation to duplicate average density profiles between separations.


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