The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Nov. 01, 2019
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Michael Sarju Vaz, Milwaukee, WI (US);

Nitya Talasila, Aurora, IL (US);

Bradley Gabrielse, Brookfield, WI (US);

Ryan Forbes, Waukesha, WI (US);

David Joseph Pitterle, Waukesha, WI (US);

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/504 (2013.01); A61B 6/032 (2013.01); A61B 6/481 (2013.01); A61B 6/486 (2013.01); A61B 6/501 (2013.01); A61B 6/507 (2013.01); A61B 6/5205 (2013.01);
Abstract

Methods and systems are provided for adaptive scan control. In one embodiment, a method includes, upon an injection of a contrast agent, processing acquired projection data of a monitoring area of a subject to measure a contrast signal of the contrast agent, estimating two or more target times of the contrast agent at the monitoring area of the subject based on the contrast signal, and carrying out a contrast scan that includes a two or more acquisitions each performed at a respective target time.


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