The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Aug. 20, 2021
Applicant:

Arris Enterprises Llc, Suwanee, GA (US);

Inventors:

Jay William Strater, San Diego, CA (US);

Paul D. Baker, San Diego, CA (US);

Gregory Nobutaka Nakanishi, San Diego, CA (US);

Subha Rajasekar, Pleasanton, CA (US);

Assignee:

ARRIS ENTERPRISES LLC, Suwanee, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/00 (2006.01); H04L 41/0654 (2022.01); G06F 16/28 (2019.01); G06F 16/2457 (2019.01); H04L 41/14 (2022.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
H04L 41/0654 (2013.01); G06F 16/24578 (2019.01); G06F 16/285 (2019.01); H04L 41/14 (2013.01); G06Q 30/016 (2013.01);
Abstract

An electronic device for use with a network device, includes: a memory, having stored therein, a first and second set of threshold weighted metric values and a remediation suggestion; and a processor configured to execute instructions stored on the memory to cause the electronic device to: obtain a first of metric values associated with a first set of metrics, respectively, within a first metric category of the network device; provide a first set of weighting factors for the first set of metric values, respectively; determine a first set of weighted metric values associated with the first set of metric values, respectively, and being based on the first set of metric values and the first set of weighting factors; and perform a remediation operation associated with the remediation suggestion when the first metric category score is lower than a first metric category score threshold.


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