The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Jul. 30, 2021
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventors:

Victor Kozlov, Toronto, CA;

Sharvil Pradeep Patil, Toronto, CA;

Hajime Shibata, Toronto, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1028 (2013.01); H03M 1/0626 (2013.01);
Abstract

Calibration of continuous-time (CT) residue generation systems can account and compensate for mismatches in magnitude and phase that may be caused by fabrication processes, temperature, and voltage variations. In particular, calibration may be performed by providing one or more known test signals as an input to a CT residue generation system, analyzing the output of the system corresponding to the known input, and then adjusting one or more parameters of a forward and/or a feedforward path of the system so that the difference in transfer functions of these paths may be reduced/minimized. Calibrating CT residue generation systems using test signals may help decrease the magnitude of the residue signals generated by such systems, and, consequently, advantageously increase an error correction range of such systems or of further stages that may use the residue signals as input.


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