The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Feb. 20, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Adam Clark, Mantorville, MN (US);

Richard J. Stevens, Monkton, VT (US);

Fernando Suarez Saiz, Armonk, NY (US);

Eric W. Will, Rochester, MN (US);

Mark Gregory Megerian, Rochester, MN (US);

Thomas J. Eggebraaten, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 20/00 (2019.01); G06F 16/901 (2019.01); G16H 10/60 (2018.01); G16H 20/00 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06F 16/9024 (2019.01); G06N 20/00 (2019.01); G16H 10/60 (2018.01); G16H 20/00 (2018.01);
Abstract

Method and apparatus for performing feature engineering using negative inferences are provided. One example method generally includes identifying a plurality of concepts and analyzing a corpus of documents to determine a first co-occurrence rate for a first concept and a second concept in the plurality of concepts. The method further includes analyzing the corpus of documents to determine a second co-occurrence rate for the second concept and at least a third concept of a set of concepts related to the first concept and determining an inverse relationship between the second concept and the third concept. The method further includes generating test data for training a machine learning model including a negative inference between the second concept and the third concept and training the machine learning model using the test data.


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