The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Apr. 09, 2020
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Jong Kang Park, Arlington, MA (US);

Dushan Wadduwage, Cambridge, MA (US);

Yi Xue, Cambridge, MA (US);

Elly Nedivi, Newton, MA (US);

Peter T. C. So, Boston, MA (US);

Christopher Rowlands, London, GB;

Kalen Berry, Florence, KY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G06V 20/69 (2022.01); A61B 1/00 (2006.01); G01N 21/64 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G06V 20/69 (2022.01); A61B 1/00172 (2013.01); G01N 21/6458 (2013.01); G02B 21/0076 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G01N 2001/282 (2013.01); G02B 2207/114 (2013.01);
Abstract

Systems and methods herein provide improved, high-throughput multiphoton imaging of thick samples with reduced emission scattering. The systems and methods use structured illumination to modify the excitation light. A reconstruction process can be applied to the resulting images to recover image information free of scattering. The disclosed systems and methods provide high throughput, high signal-to-noise ratio, and high resolution images that are depth selective.


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